S SPACE RHA
Disclaimer: The radiation test data presented here was extracted from publicly available IEEE Radiation Effects Data Workshop (REDW) and RADECS REDW publications using automated methods and has not been independently validated. Users are solely responsible for reviewing the referenced source publications to verify the applicability, accuracy, and completeness of all radiation test results before use in any design, analysis, or qualification activity. Space RHA assumes no liability for decisions made based on this data.

REDW Radiation Effects Distributions 2025 Updated

IEEE Radiation Effects Data Workshop & RADECS REDW | 1992–2025 | Survival ECDF — right-censored pass data
Help & Reference
1,284
Papers
6,153
Part Records
3,382
Unique Parts
5,609
COTS Parts
248
Rad-Hard / Space
2,195
DD Records
261
2025 Records
Grade: Rad-Hard/Space: 432 records (233 w/TID, 179 w/SEL, 252 w/DD)  |  COTS: 7602 records (2100 w/TID, 1791 w/SEL, 2071 w/DD)
Year range:
1982 1982 – 2025 2025
Drag sliders to filter by publication year — earlier years ≈ older process nodes
TID threshold: 0 2000 Off Set minimum TID pass level (krad) — reference line on TID chart, filters Parts List
DD threshold: 10⁸ 10¹⁷ Off Set minimum DD fluence (n/cm²) — reference line on DD chart, filters Parts List

Total Ionizing Dose (TID) Hardness — Survival Distribution All Parts

Fraction of tested devices confirmed functional at or above each TID level (log x-axis). Right-censored survival data — actual failure thresholds may be higher than the tested levels shown.
Showing All Parts — combines COTS and Rad-Hard/Space/QML. Use grade buttons and year slider above, or device-type chips below, to filter.

SEL Immunity — LET Threshold Distribution All Parts

Fraction of tested devices confirmed SEL-immune at or above each LET level. Values near 120 MeV·cm²/mg often represent the maximum available facility LET.
Showing All Parts — combines COTS and Rad-Hard/Space/QML.

Displacement Damage (DD) — 1 MeV Neutron Equiv. Fluence Distribution All Parts

Fraction of tested devices surviving at or above each 1 MeV neutron equivalent fluence level (n/cm², log x-axis). Extracted from 833 papers across REDW, TNS, and RADECS proceedings. Right-censored — actual damage thresholds may be higher.
Showing All Parts — combines COTS and Rad-Hard/Space/QML. Use grade buttons and year slider above, or device-type chips below, to filter.

SEB / SEGR — Destructive SEE in Power Devices

Threshold voltages for Single Event Burnout (SEB) and Single Event Gate Rupture (SEGR) in power MOSFETs, diodes, and SiC devices, plotted as percentage of rated voltage vs. LET. Data from NASA NEPP/GSFC publications.
Dashed lines show 75% (EEE-INST-002 derating) and 50% (Casey recommended derating) of rated voltage.

Summary Statistics by Device Type All Parts

Percentile statistics (full year range). Switch grade above to compare populations.
Device Type N RecordsN TID TID P10 (krad)TID MedianTID P90 N SEL SEL P10 (MeV·cm²/mg)SEL MedianSEL P90 N DD DD P10 (n/cm²)DD MedianDD P90
BJT3611828603004649861201493.2e+112.0e+144.5e+14
Op-Amp7512948303002298771202601.0e+111.2e+122.7e+14
Comparator19342810010030551201201071.0e+111.2e+135.0e+15
Voltage Ref1841141010020034597586741.0e+111.0e+132.7e+14
Linear Reg353176810030013860861201831.0e+111.0e+144.5e+15
Power Converter37415884230015215801201261.0e+111.0e+122.7e+14
ADC35515483030020231801201161.5e+111.0e+121.1e+13
DAC85205810024690120183.5e+111.8e+124.0e+15
FPGA3888284910001103801201173.1e+112.0e+135.0e+14
MOSFET288442503188139861201301.0e+111.0e+131.0e+16
Optocoupler166291020030012611201201263.5e+112.0e+127.0e+12
SRAM19448221004003110572.8e+096.0e+103.0e+12
Flash1154411100400321156120301.0e+094.2e+117.2e+13
Logic / Interface15364112100633075120301.0e+099.4e+113.2e+14
MCU / Processor14667220300501462125366.1e+102.3e+113.0e+12
Sensor6636735120151293120241.0e+112.3e+112.0e+12
Diode9215212168606186120351.0e+091.0e+113.1e+14
Solar Cell5500552.0e+121.0e+136.8e+13
Other3,74578047541065514861206621.0e+101.4e+122.0e+14

Parts List — Filtered Results All Parts

Part numbers matching current filters (grade, year range, device type, TID threshold). Click column headers to sort. Use filters above and device chips on TID/SEL tabs to refine.
Showing All Parts with TID data. Set a TID threshold above to filter by minimum pass level.
Part Number Device Type TID (krad) SEL LET DD (n/cm²) Year Grade Source