Preliminary analysis aid. Check the result against your own analysis and, where it matters, a test on your part. Full disclaimer.
On orbit single event rates for a parts list: heavy ion rates by integrating each part's cross section over the LET spectrum of the chosen environment, proton rates by integrating a proton cross section over the proton energy spectrum, and a system total with Monte Carlo confidence levels. Parts with no test data get a bounding rate from technology priors (the Ladbury approach); parts with a null result get a Poisson upper bound. Output is events per device per day and per system per day, the mean time between events at the 90 percent level, per part contributions sorted by size, and a PDF report. Everything runs in the browser.
Built in heavy ion LET spectra and proton spectra, all from one set of CREME96 runs made on 11 and 12 September 2026 with the same settings: solar minimum (the CREME96 solar quiet mode, 1977), AP8MIN trapped protons, quiet magnetosphere unless the label says stormy, Z = 1 to 92 transported through 100 mil of aluminum, LET spectra in silicon for Z = 2 to 92. The heavy ion set: GCR at solar minimum at GEO (the worst case for heavy ions and the usual design case), ISS 400 km 51.6 degrees with the quiet and with the stormy magnetosphere, LEO 400 km 28.5 degrees, the 550 km 53 degree constellation orbit, sun synchronous 600 km 97.8 degrees, polar 1200 km 87.9 degrees, MEO 20,200 km 55 degrees, GTO 200 x 35,786 km 27 degrees, the lunar and Mars surfaces (GCR with planetary shadowing), and the worst week, worst day and peak 5 minute solar particle event models at GEO. The proton set is the Z = 1 block of the same transported spectra, trapped plus galactic plus (for the event cases) solar protons, as the integral flux above energy; a legacy AP-8 table for 1470 km 53 degrees is kept for continuity. Two cautions. The low inclination 400 km case has no heavy ion flux above LET 20 MeV cm2/mg at all: the quiet time geomagnetic cutoff at 28.5 degrees excludes the low energy heavy ions that carry the high LET, so a part with an onset above 20 gets a zero rate there; use the ISS stormy case as the conservative bound for a disturbed magnetosphere. And the MEO table is a solar minimum spectrum (an earlier label called it solar maximum; the table did not change). Or import your own from CREME96 (native .LET integral spectrum output with % header lines) or as a two column text file (LET in MeV cm2/mg, differential flux) from OMERE or anything else. Proton spectra import as a CREME96 FLUX or TRANS output (.flx or .tfx, read natively: the proton block of the differential spectrum is integrated above each energy and converted from per m2 per s per sr to per cm2 per day over 4 pi steradian, the way the built in tables were made), or as two columns, energy in MeV and the integral flux above that energy, in the unit picked next to the import button (per cm2 per s, per cm2 per day, or per m2 per s per sr). A second column that rises with energy is refused, since it is a differential spectrum. The shielding depth is whatever the spectrum was generated behind; the tool does not transport.
Correction, September 2026: earlier versions used an imported proton file as it came. This page described the second column as a differential flux while the rate used it as the integral flux, and a file in per cm2 per s gave proton rates 86,400 times too low. The built in tables were not affected. Recompute any proton rate made with an imported file.
One row per part: name, quantity, technology, and one of four data categories.
| Category | You supply | Rate method |
|---|---|---|
| Full Weibull | sigma_sat, L_th, W, s | Spectral integration |
| Partial | L_th and/or sigma at one LET | Missing parameters sampled from empirical priors in the Monte Carlo |
| Null result | Test LET and fluence, no events | Poisson upper bound on the cross section, bounding rate versus test LET |
| No data | Technology only | Ladbury bounding with technology susceptibility priors |
A proton cross section (Bendel or Weibull in energy) can be entered per part; otherwise it is estimated from the heavy ion parameters.
The RPP depth to width ratio Z/X (default 0.01), mission duration, and the number of Monte Carlo iterations (default 10,000).
The rate is the integral of the cross section over the differential LET flux:
It is evaluated on a log spaced LET grid from L_th to the top of the spectrum as a summation by parts:
where Φeff is the effective flux at Li described below. Written this way the rate is a Stieltjes integral of the effective flux with respect to the measured cross section, R = ∫ Φeff dσ, and that is the point of the formulation: everything about the environment and the geometry sits in Φeff, which is tabulated once per environment, and everything about the part sits in σ(L), which is what the test measured. Integrating in sigma rather than in L also puts the grid resolution where it is needed, near threshold, where the flux is steepest.
This is Larry Edmonds' formulation of the heavy ion rate calculation, developed at the Jet Propulsion Laboratory and set out in his recommendations on the use of CREME96 for heavy ion rate calculations [9]. The conventional CREME96 path converts the cross section curve into a critical charge and an RPP with a guessed depth and integrates the chord length distribution; Edmonds showed the same physics can be carried entirely in an effective flux that depends only on the environment and the aspect ratio of the sensitive volume, so that the measured curve is used directly and the unknown depth appears as one explicit parameter whose worst case can be taken. The rate engine on this site descends from an implementation of that method and carries the effective flux tables computed his way. His later work extends the same picture to devices sensitive to particle energy and range [10], [11] and to non planar sensitive volumes through the alpha law [12], which the alpha law tool implements.
| Parameter | Units | Meaning and typical range |
|---|---|---|
| σsat | cm2 | Limiting cross section at high LET. About 1e-8 cm2 for SEL in small parts up to 1e-3 cm2 for SEU in large memories. |
| Lth | MeV cm2/mg | Onset LET. Below 1 for sensitive commercial parts, above 40 for hardened ones. |
| W | MeV cm2/mg | Width of the rise from onset to saturation. |
| s | none | Shape. Near 1 is an exponential rise; larger is closer to a step. |
The isotropic flux crosses the sensitive volume along a distribution of path lengths, and a long oblique chord lets a lower LET ion deposit the critical charge. Following Edmonds, the tool models the volume as a rectangular parallelepiped of depth to width ratio Z/X, integrates over solid angle for both path length and projected area, and folds the result with the environment spectrum into an effective flux Φeff(L; Z/X). The path length integral uses the full chord length distribution of the box, not its mean: for each direction the area over which the chord is at least a given length is the projected area of the box shrunk along the beam, a quadratic in the chord, so the fold with the spectrum reduces to three moments of the differential flux (the integral flux and its first two inverse moments) and an angular quadrature. This is the same integral CREME96's integral RPP performs and the closed form of the I-HICUP rate on the alpha law page, and the two agree to a fraction of a percent. Six of the eleven built in environments (GTO, LEO constellation, MEO, sun synchronous, lunar surface, Mars surface) had been folded earlier with the mean chord of each direction in place of the distribution; that approximation runs 25 to 80 percent low at Z/X = 0.2 because the chords longer than the mean let the far more numerous lower LET ions upset, and those six tables were regenerated with the exact folding in September 2026. Of the five older tables, the three solar particle events and ISS already used the full distribution and are unchanged; the GCR solar minimum table, the default, was 5 to 25 percent low at Z/X = 0.2 against the exact folding of its own spectrum (the spectrum itself agrees with a 2024 CREME96 run, solar quiet, near earth interplanetary, 100 mils of aluminum, to 0.2 percent) and was regenerated from that run, 1002 bins from 0.001 to 110 MeV cm2/mg. The tables are precomputed for 11 values of Z/X and interpolated for the value you enter. Because Φeff at each LET is largest for some aspect ratio, taking the maximum across all ratios at each LET gives a rate that bounds every geometry; that geometry independent upper bound is Edmonds' as well and is reported alongside the best estimate.
| Z/X | Meaning |
|---|---|
| 0.01 | Thin sheet; close to the cosine law worst case. The default when the geometry is unknown. |
| 0.2 | Moderate depth; a common best estimate for planar CMOS. |
| 1.0 | Cube; the isotropic limit. |
The ratio moves the rate by a factor of two to five or more for the same Weibull. It is one of the largest single uncertainties in the calculation, and it is rarely known for a commercial part. Z/X = 0.01 is the conservative default; do not argue for a larger ratio without a die cross section or a vendor statement to point at.
σp is a function of proton energy because the mechanism is a nuclear reaction, not direct ionization. Parts with Lth above 15 MeV cm2/mg are treated as proton immune: 15 is roughly the highest LET a silicon recoil reaches. Without proton data the tool estimates σp from the heavy ion Weibull with a Bendel type convolution over reaction products, with the proton threshold energy tied to the heavy ion onset and a linear rise to saturation. Total rate is heavy ion plus proton, reported separately as well as summed. In LEO and during solar events the proton term can dominate for low threshold parts.
10,000 iterations by default. Each iteration samples the uncertain quantities, runs the integration for every part, and sums. Reported: mean, and the 90, 95 and 99 percent levels of the rate distribution, with histograms and a survival probability plot over the mission. For full Weibull parts the sampled quantity is a beta distributed scale factor whose spread widens as Lth falls, reflecting how poorly the steep part of the spectrum is usually pinned. For partial and no data parts the sampling covers the missing parameters (below).
No data. Each iteration first draws whether the part is susceptible at all, with a technology prior, then a threshold from the historical distribution, then a saturated cross section conditioned on that threshold:
W and s come from a library of empirically observed pairs. Default susceptibility priors, editable in the tool:
| Technology | P(SEL susceptible) | Technology | P(SEL susceptible) |
|---|---|---|---|
| Bulk CMOS | 70% | SiGe | 25% |
| CMOS SOI | 10% | FPGA | 60% |
| BiCMOS | 50% | Flash | 55% |
| Bipolar | 30% | DRAM | 55% |
| GaAs | 5% |
Null result. The Poisson upper bound on the cross section from zero events at the test fluence, combined with an empirical power law in test LET:
These follow Ladbury's single point bounding approach [5]. They are bounds. If you have one non zero cross section point, the right description of the result is also a bound, not a characterization, and the report should say so.
No confidence interval produced here includes every source of model error. The important limitations are:
[1] E. L. Petersen, "The SEU Figure of Merit and Proton Upset Rate Calculations," IEEE Trans. Nucl. Sci., vol. 39, no. 6, pp. 1600 to 1612, Dec. 1992.
[2] J. H. Adams, Jr., "CREME: The 2011 Revision of the Cosmic Ray Effects on Micro-Electronics Code," Naval Research Laboratory, NRL/MR/6021--11-9321, 2011.
[3] A. J. Tylka et al., "CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code," IEEE Trans. Nucl. Sci., vol. 44, no. 6, pp. 2150 to 2160, Dec. 1997.
[4] L. D. Edmonds, "Proton SEE Rate Estimations for Single Event Latchup and Single Event Burnout," Jet Propulsion Laboratory, JPL Publication 00-05, 2000.
[5] R. Ladbury, "Use of Single-Point Estimates to Bound SEL Rates," IEEE Trans. Nucl. Sci., vol. 54, no. 6, pp. 2465 to 2470, Dec. 2007; and R. Ladbury, "Updated SEL Rate Bounding Method," IEEE NSREC Short Course, 2017.
[6] E. L. Petersen, Single Event Effects in Aerospace, Wiley-IEEE Press, 2011.
[7] J. C. Pickel and J. T. Blandford, Jr., "Cosmic Ray Induced Errors in MOS Memory Cells," IEEE Trans. Nucl. Sci., vol. 25, no. 6, pp. 1166 to 1171, Dec. 1978.
[8] J. N. Bradford, "Geometric Analysis of Soft Errors and Oxide Damage Produced by Heavy Cosmic Rays and Alpha Particles," IEEE Trans. Nucl. Sci., vol. 27, no. 6, pp. 1480 to 1488, Dec. 1980.
[9] L. D. Edmonds, "Recommendations Regarding the Use of CREME96 for Heavy-Ion SEU Rate Calculations," Jet Propulsion Laboratory, California Institute of Technology. The effective flux formulation of the rate integral, the aspect ratio tables and the geometry independent upper bound used by this tool.
[10] L. D. Edmonds and L. Z. Scheick, "Effect of Shielding on Single-Event Rates in Devices That Are Sensitive to Particle Range," IEEE Trans. Nucl. Sci., vol. 57, no. 6, pp. 3560 to 3565, Dec. 2010.
[11] L. D. Edmonds, L. Z. Scheick and M. W. Banker, "Single Event Rates for Devices Sensitive to Particle Energy," IEEE Trans. Nucl. Sci., vol. 59, no. 6, pp. 2936 to 2944, Dec. 2012.
[12] L. D. Edmonds, "A Method for Correcting Cosine-Law Errors in SEU Test Data," IEEE Trans. Nucl. Sci., vol. 49, no. 3, pp. 1522 to 1538, June 2002.