Disclaimer:
This tool and its accompanying documentation are provided for
preliminary analysis and educational purposes only.
Results have not been independently verified or validated for use in
mission-critical decisions. Users are solely responsible for verifying all
outputs against their own analysis and applicable standards before making any
design, test, or mission decisions. Space RHA LLC makes no warranties, express
or implied, regarding the accuracy, completeness, or fitness for any particular
purpose of the results produced by this tool, and shall not be held liable for
any damages arising from its use.
1. What Question Does This Tool Answer?
Many programs test parts or boards with protons only, protons are cheap, penetrating,
and don't require delidding. A null proton result is then offered as evidence the hardware is
safe against heavy ions. This tool quantifies exactly how much that evidence is worth,
and what risk remains, for missions whose heavy-ion exposure matters (anything beyond a benign
LEO). It implements the coverage and rate-bounding framework of Ladbury & Lauenstein
(IEEE TNS 2016) with the site's CREME96 mission environments.
The core physics:
protons cause SEE almost entirely through nuclear-reaction recoils, about
1 recoil per 289,000 protons at 200 MeV. Those recoils are light (Z ≤ 15 in silicon),
reach at most ~14–16 MeV·cm²/mg, and have ranges of only a few microns. A
proton test is therefore a low-fluence, low-LET, short-range heavy-ion test in disguise. Each
of those three deficiencies is modeled here.
2. How It Works
- Recoil coverage. The test's recoil population is expressed as an integral
fluence vs. equivalent LET, LETEQ = Edep/ρd. Because a short-range
recoil cannot sustain its LET across a deep sensitive volume, this distribution collapses
toward low LET as SV depth grows, at 10 µm depth it dies near 8–9
MeV·cm²/mg; at 25–30 µm (power MOSFET SEB/SEGR) almost nothing
survives above ~3. This is the range/SV-depth effect and it is why destructive modes are
weakly covered by protons at any fluence.
- Model-grid bounding. For each candidate Weibull σ(LETEQ)
on the published grid (onset 0.5–6.5, width 5–25, shape 0.5–2.5), the
expected test event count per unit cross section is computed; the Poisson upper limit on
your observed count (2.30 for zero events at 90%) bounds σsat for that
model. Models whose bound is tighter than the τ criterion are "meaningfully bounded";
the rest are unconstrained by the test.
- Mission rates. Every model, bounded at its σ limit,
unbounded at the die-area geometric cap, is run through full CREME96 spectral
integration for your mission environment and duration (episodic flare handling identical to
the SEL Test-LET tool). The worst bounded model gives the demonstrated bound; the
worst overall gives the residual risk.
3. Reading the Results
The hero number is the residual worst case: expected SEE over the mission if
the part's true behavior is one the proton test could not constrain, capped only by die
geometry. The verdict separates what the test demonstrated (the bounded
fraction of susceptibility behaviors and their worst-case mission events) from what it did not
(the unbounded fraction and its geometric worst case). The coverage chart is
the picture worth keeping: wherever the orange mission curve lies above the cyan test-recoil
curve, flight will probe LET the test never reached.
| Output | Meaning |
| Recoils on die | Total recoil ions the test put through the die (Φ/289k at 200 MeV, scaled by energy and area) |
| Max LET_EQ probed | Highest LET_EQ at which the test had statistical power (expected ≥ μUL recoils on the die) |
| % models unbounded | Fraction of candidate σ vs. LET behaviors the test cannot constrain, the coverage gap |
| WC bounded rate | Worst mission rate among constrained models at their σ upper limits |
| WC residual rate | Worst mission rate among ALL models, unconstrained ones capped at die area, the residual risk |
| Area with 10% chance of 0 hits | Areal coverage metric (2016 Sec. II): contiguous die area plausibly never struck by any recoil |
4. Practical Guidance
- Shallow, nondestructive SEE (SEU/SET): protons work. At ≥10¹¹
p/cm² and 200+ MeV, nearly all candidate behaviors with onset < ~6.5
MeV·cm²/mg are bounded. Onsets above ~6–7 are never probed, but for
soft errors the un-probed region often contributes acceptably low rate. Run the numbers.
- SEL in bulk CMOS (SV ~10 µm): marginal. At the standard
10¹⁰ fluence roughly 70% of behaviors are unbounded; even 3×10¹¹
leaves ~40%. Use the highest available proton energy (400–500 MeV roughly halves the
unbounded fraction) and treat the result as a screen, not a bound.
- SEB/SEGR in power devices (SV ≥ 20 µm): protons place almost no
constraint, at any fluence or energy. The residual risk is essentially the untested
geometric worst case. Heavy-ion testing at proper range/angle (per the site's beam
calculator) is the only meaningful path.
- Gold-plated lids / W near die: the high-Z option adds p+Au fission
recoils (LETEQ to ~38 shallow), which genuinely extends shallow coverage, and is also a reminder that such packages can suffer proton-induced destructive events in
flight (the OP470 lesson).
- Board-level tests: the bound scales with the number of parts, each
part could hide a different susceptibility, so the summed limiting cross section (and the
bounding rate) grows linearly with part count. Set the parts input accordingly.
- Retiring the residual: the unbounded fraction can only be closed with
heavy-ion data, technology-based arguments (e.g. SOI, epi thickness), or explicit Bayesian
priors, the same options the source paper recommends. The SEL Test-LET tool's
historical priors are one defensible source.
5. Proton-Informed Monte Carlo (Bayesian Flow)
The worst-case bounds of Sections 2–3 answer "how bad could it be?" The Monte Carlo card
answers the complementary question: "given what we historically know about parts like this,
how likely is trouble?" Each trial draws a hypothetical part from the same historical prior
as the SEL Test-LET tool, technology susceptibility fraction (Extended Historical SEL Priors, EHSP 2026-09, posteriors, selectable by population stratum: modern, all eras, mission-candidate, Space-RHA campaigns),
onset-LET CDF, lognormal limiting cross section, CERN Weibull shapes, weights that draw
by the Poisson likelihood of your actual proton result, and evaluates its mission rate by
CREME96 spectral integration. The reported quantities are the prior (untested) and posterior
(post-test) mission SEL probabilities, the posterior probability the part is susceptible at
all, and the posterior onset LET, the "rough demonstrated LET
threshold": what a passed proton test entitles you to believe about LET₀, given the
historical population.
- A null result shifts belief rather than proving safety: it suppresses low-onset,
large-σ behaviors (which the recoils would have found) and leaves high-onset behaviors
untouched, so the posterior onset median moves up and mission risk drops by a factor
that depends strongly on SV depth and fluence.
- Observed events collapse the posterior the other way: susceptibility confirmed, onset
localized to the low-LET region consistent with the event count.
- For deep SV (SEB/SEGR) the update is honest about its weakness: the likelihood barely
discriminates, so posterior ≈ prior, protons taught you little, and the card
flags that the SEL-derived prior is qualitative for those modes.
This is the Bayesian supplement the 2016 paper recommends for
exactly this situation: explicit priors carrying the assumptions, proton data doing the
updating, and the residual quantified as a probability instead of an open question.
6. What the Paired Data Say
The combined SEL test corpus contains 95 parts with both heavy-ion and proton SEL records
(92 from published REDW, RADECS and NASA GSFC sources; internal reports enter the
counts only). Heavy-ion onset is the uniform LET@10⁻⁸ from the Poisson-Weibull fit
where a fit exists, else the author-stated threshold. The tool page shows these numbers live;
the case-study page lists every public part.
- Proton SEL tracks low onset. Parts that latched under protons have a
median heavy-ion onset of 3.0 MeV·cm²/mg (16 of
20 below LET 10). No part with onset above 20 has produced a proton SEL anywhere
in the corpus.
- A null is not a threshold. Of the 30 parts with an adequate null
proton test (≥ 50 MeV, ≥ 10¹⁰ p/cm²) and heavy-ion data, 7
(23%, 90% interval 13–38%)
were heavy-ion susceptible at LET ≤ 37, and 5 (17%) at LET ≤ 15
the population this tool exists to quantify. Detection probability by onset bin
(events vs. adequate nulls): <5: 82%, 5–10: 33%
(n=3), 10–20: 71%, ≥ 20: no events.
- Cross-section ratio. Where both cross sections are measured, σp
(≥ 100 MeV) / σHI has a median of 10-7.09
(range 10-10.37–10-6.05, n=5),
one to two decades below the 1-in-289,000 recoil-count ceiling: most recoils that do occur
deposit less than the part's onset.
- Energy thresholds are real. XCZU9EG: no SEL at 30 MeV, SEL at 50 MeV rising
×16 to 200 MeV; BU65170G1: none at 80 MeV, SEL at 190 MeV; K6R4016V1D: fitted proton
threshold 51 MeV; ADS1271: σp grows >40× from 100 MeV to 24 GeV
(tungsten vias). Test at the highest energy you can get.
7. Validation Against Paired Data
The engine was run on the paired parts with a known heavy-ion Weibull (11 parts,
16 proton tests) using the tool's default settings.
- Bounding (null results). For the 4 heavy-ion-susceptible
parts with an adequate null proton test, the tool called out residual risk (models left unbounded)
in every case at 2, 5 and 10 µm SV depth, 0 missed
escapes, 0 bound violations. Small n, but it is the falsification
test that matters: the tool never declared a susceptible part safe.
- Forward prediction. Predicting the measured proton cross section from the
heavy-ion curve (12 measurements): median predicted/measured
×1.05 at 5 µm
(58% within ×10,
33% within ×3); ×2.69 at 2 µm and
×0.26 at 10 µm. Treat the emulator as an
order-of-magnitude instrument whose main uncertainty is the SV depth you assign.
- Known failure modes. Parts with onset ≥ 10 that still show rare proton SEL
(GP2021 micro-latch at 4×10⁻¹³ cm²; ADS1271 at 4×10⁻¹² cm²
through tungsten vias): the silicon-recoil emulator predicts essentially zero at ≥ 5 µm;
switching on the high-Z option brings ADS1271 to within ×1.71.
Multi-die hybrids (BU65170G1) are over-predicted ×30–350 because the package geometry
is not represented.
Reproducible: the pairing script, adjudications and harness live in
the Space-RHA proxy-validation folder (build_proton_hi_pairs.py,
build_public_aggregates.py, proxy_validation_harness.js); rerun them
as the corpus grows.
8. Accuracy and Limitations
- The recoil fluence-vs-LETEQ family is an emulator of the
published CRÈME-MC results, not a transport calculation. Validation: worst-case
bounded rate at ISS / 10 µm / 10¹⁰ 200-MeV reproduces the published
power-law within ×1.04; the %-unbounded matrix matches 2016 Fig. 9 within about
±8 points across 50–400 MeV; bounds drift conservative (up to ~×4) at
10¹² p/cm².
- The τ = 0.003 cm² "meaningful bound" criterion is calibrated to reproduce the
paper's bounded/unbounded classification; it is editable under Advanced.
- LETEQ treats deposited energy as if uniform across the SV; real charge-collection
efficiency profiles, angular effects, and SEGR's gate-oxide field dependence are not modeled
the 2015 poster shows these make proton tests underestimate destructive
risk, so treat destructive-mode results as optimistic.
- In-flight proton-induced SEE (trapped/solar protons causing events by the same recoil
mechanism) is a separate calculation, use the SEE Rate Assessment Tool's proton
rates; a null ground test at adequate fluence bounds that too.
- Facility energies are limited to the 50–500 MeV range of the underlying data.
9. References
[1] R. Ladbury and J.-M. Lauenstein, “Evaluating Constraints on
Heavy-Ion SEE Susceptibility Imposed by Proton SEE Testing and Other Mixed Environments,”
IEEE Trans. Nucl. Sci., vol. 64, no. 1, pp. 301–308, 2016.
[2] R. Ladbury, J.-M. Lauenstein and K. P. Hayes, “Use of Proton SEE
Data as a Proxy for Bounding Heavy-Ion SEE Susceptibility,” IEEE Trans. Nucl.
Sci., vol. 62, no. 6, pp. 2505–2510, 2015.
[3] D. M. Hiemstra and E. W. Blackmore, “LET Spectra of Proton Energy
Levels From 50 to 500 MeV and Their Effectiveness for Single Event Effects Characterization of
Microelectronics,” IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2245–2249,
2003.
[4] P. M. O'Neill, G. D. Badhwar and W. X. Culpepper, “Internuclear
Cascade-Evaporation Model for LET Spectra of 200 MeV Protons Used for Parts Testing,”
IEEE Trans. Nucl. Sci., vol. 45, no. 6, pp. 2467–2474, 1998.
[5] T. L. Turflinger et al. “RHA Implications of Proton on Gold-Plated
Package Structures in SEE Evaluations,” IEEE Trans. Nucl. Sci., vol. 62, no. 6,
pp. 2468–2475, 2015.
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