SEL Test-LET Requirement Tool

Help & User Guide

Disclaimer: This tool and its accompanying documentation are provided for preliminary analysis and educational purposes only. Results have not been independently verified or validated for use in mission-critical decisions. Users are solely responsible for verifying all outputs against their own analysis and applicable standards before making any design, test, or mission decisions. Space RHA LLC makes no warranties, express or implied, regarding the accuracy, completeness, or fitness for any particular purpose of the results produced by this tool, and shall not be held liable for any damages arising from its use.

Contents

  1. Overview: What Question Does This Tool Answer?
  2. Quick Start
  3. The Statistical Model in Plain Language
  4. Choosing a Reliability Criterion
  5. Environments and the Flare Exposure Model
  6. Input Reference
  7. Reading the Results
  8. The Three Charts
  9. Worked Examples
  10. Advanced Settings
  11. Accuracy, Caveats, and Limitations
  12. References

1. Overview: What Question Does This Tool Answer?

Suppose you are building a system from commercial, unhardened CMOS parts and you cannot heavy-ion test every part to destruction-level fluences. A practical compromise is a screening requirement: test every potentially SEL-susceptible part up to some LET, LETT, and fly only parts that show no latchup below that level. The question is: how high does LETT need to be so that the system, as a whole, meets a stated reliability over the mission?

This tool answers that question using the statistics of historical single-event latchup test data, the augmented CERN + JPL database of 66 unhardened CMOS part types, rather than data on your specific parts, which by assumption you do not yet have. It implements and extends the system-level method of Ladbury & Joplin (IEEE TNS 2026), built on the historical prior of Ladbury, Allen, Irom, Gaza, Vartanian, Barth & Hodson (IEEE TNS 2025). The extensions unique to this implementation are CREME96 environment-based rate integration (in place of the Petersen figure-of-merit), an episodic solar-flare exposure model, and an n-of-m constellation survivability criterion.

In one sentence: given how bad unhardened CMOS parts have historically been, how hard do I have to screen so that a system of N such parts probably won't latch up during my mission?

2. Quick Start

  1. Pick a reliability criterion, the paper criterion (expected <1 SEL per mission) for comparability with the published method, the strict zero-SEL criterion for conservative single-spacecraft requirements, or the constellation criterion for n-of-m fleet survivability.
  2. Set the confidence and reliability targets, e.g. 90% confidence, 99% reliability.
  3. Enter the part count, either the number of SEL-susceptible parts directly, or total unhardened CMOS count times a susceptible fraction. For the constellation criterion this is the count per satellite.
  4. Set mission duration and environment, GCR solar minimum is the default quiet-time GEO/interplanetary case; add flare episodes or choose the composite for solar-active exposure.
  5. Compute. The large number is the required test LET in MeV·cm²/mg. Read the verdict sentence below it for the exact statistical statement being made, and check the cross-checks line for how other criteria/methods compare.

3. The Statistical Model in Plain Language

Each Monte Carlo trial builds one hypothetical system from parts that are statistically similar to the historical database:

Epistemic vs. aleatoric: the Monte Carlo spread represents ignorance about which parts you got (epistemic uncertainty over the historical prior). The Poisson math on top of each realization represents in-flight randomness (aleatoric). The confidence level applies to the first; the reliability target applies to the second. Keeping these separate is what makes the constellation criterion meaningful.

4. Choosing a Reliability Criterion

Paper criterion: expected <1 SEL per mission (Pₛ)

Reliability is the fraction of Monte Carlo realizations whose expected SEL count over the mission stays below one. This is the definition behind Figs. 3–6 and the closed-form Eq. (4) of the system-level paper, so use it when you want numbers traceable to the published curves. It is the most permissive of the three criteria: it tolerates an expected count approaching one event per mission.

Strict criterion: zero SELs at confidence

Takes the confidence-level quantile of the system rate distribution and requires the Poisson probability of zero SELs over the mission to meet the reliability target. Every SEL is treated as mission-ending. At 99% reliability this tolerates a rate roughly 100× lower than the paper criterion (−ln 0.99 ≈ 0.01 expected events vs. 1), so the required LETT is substantially higher, often pushed into the regime where the 3.5% beyond-database floor governs. Use it for single-string spacecraft where any latchup is unacceptable.

Constellation criterion: n-of-m satellites SEL-free

For a fleet of m identical satellites, each carrying the specified number of susceptible parts, requires that at least n of m remain SEL-free through the mission, at the stated confidence and reliability. Two structural assumptions matter:

P(≥n of m) = Σk=n..m C(m,k) pk (1−p)m−k,   p = exp(−RCL·TM)

Because the binomial tail is monotone in R, the confidence quantile is applied to the rate distribution and the tail evaluated there. Setting n = m = 1 exactly recovers the strict criterion. Redundancy earns real credit: accepting the loss of 2 of 8 satellites typically reduces the required LETT by 15–20 MeV·cm²/mg relative to a single-satellite zero-SEL requirement at the same confidence.

Note: every SEL is conservatively treated as satellite-ending. If only a fraction of SELs are truly mission-ending (e.g. supply-current events cleared by watchdog power cycling), you can emulate a lethality fraction f by scaling the mission duration by f.

5. Environments and the Flare Exposure Model

Continuous environments

GCR Solar Minimum (galactic cosmic rays behind 100 mil aluminum, CREME96, solar-quiet worst case for GCR) and ISS (400 km, 51.6° geomagnetically shielded) are applied for the full mission duration. These are the appropriate baselines for long-duration missions. GCR solar minimum is the default and matches the "GEO / interplanetary" intent of the source paper's CE = 400.

Episodic (flare) environments

Worst Week, Worst Day, and Peak 5-minute are CREME96 solar particle event environments. They are transient by definition, and applying them for a full mission would be physically meaningless, a "10-year worst week" overstates the exposure by a factor of 500. The tool therefore treats them as episodes: you specify the expected number of events per year, and each event contributes its flux for its episode duration only (7 days, 1 day, and 5 minutes respectively). Because Poisson exposures add, this folds into an exact mission-averaged rate:

R = Rcontinuous + Rflare · (Dep · Nyr) / 365.25

All reliability math downstream (expected counts, zero-SEL Poisson, constellation binomial) remains exact over the mission, and the mission-duration sweep chart stays meaningful, longer missions accumulate proportionally more episodes.

Short missions (launch vehicles, transfer stages): when the mission is shorter than one episode, mission-averaging answers the wrong question. A 6-hour launch doesn't care about the expected number of worst days per year it cares what happens if the event is in progress during the flight. The tool detects this automatically: for missions shorter than the episode duration, the flare flux is applied continuously for the entire mission (the standard conditional planning case), and the verdict is labeled "event in progress." For a 6-hour flight, select Worst Day and enter 6 hours; for a hypothetical flight through the flare peak itself, select Peak 5-min with a 5-minute duration as a stress check.

Composite mission

GCR + worst-week solar events applies GCR solar minimum continuously plus your stated number of worst-week episodes per year. This is the recommended design case for solar-active mission phases. Be aware that for SEL the flare episodes usually dominate: even one worst week per year typically contributes more to the requirement than ten years of quiet-time GCR.

Petersen FOM modes

The two FOM options reproduce the source-paper engine exactly (verified bit-identical): the figure-of-merit bound with CE = 400 (GEO/interplanetary GCR) or a custom CE, reduced by the beta-distributed bound-to-rate ratio. Use these for direct comparison with the published curves. When a CREME96 environment is primary, the tool automatically reports the FOM equivalent in the cross-checks line. The two methods are statistically consistent where they should be, at LET₀ = 10 MeV·cm²/mg the mean spectral-to-bound rate ratio in GCR solar minimum (0.18) matches the mean of the paper's beta distribution, but the FOM is a bound, so FOM-mode requirements typically run 10–20 MeV·cm²/mg higher than GCR spectral-mode requirements.

6. Input Reference

InputMeaningTypical values
Reliability criterionStatistical definition of "system survives" (Section 4)paper / strict / n-of-m
Confidence levelQuantile over the historical prior (epistemic). Applies to the strict and constellation criteria, and to the rate charts90–95%
Desired system reliabilityTarget probability the criterion is met97–99.5% (closed-form fit validity); up to 99.99% accepted
Satellites m / required nConstellation criterion only: fleet size and minimum survivorse.g. 8 / 6
Device countThree bases: SEL-susceptible parts directly (NP); total unhardened CMOS × a single susceptible fraction; or a technology mix, part counts per technology, each carrying an editable susceptible probability defaulted to its EHSP 2026-09 posterior for the modern stratum (parts tested or published 2010 and later: Bulk CMOS 0.45, ADC/DAC 0.83, BiCMOS 0.39, SiGe 0.25, SRAM 0.83, DRAM 0.29, Flash 0.54, SRAM-FPGA 0.32, antifuse FPGA 0.05, SOI 0.06, SOS 0.07, BCD 0.42, Unknown 0.35). Per satellite in constellation mode5–50 (source-paper fit range)
Susceptible fractionTotal-CMOS mode only: single fraction applied to all parts (historically roughly half)0.4–0.6
Mission durationDuration at the stated exposure, in years, days, or hours (0.1 hour to 30 years)6 h (launch) to 20 yr
EnvironmentExposure model and rate method (Section 5)GCR SolMin default
Solar events per yearEpisodic/composite modes: expected event count per year at the selected severity0.2–5

7. Reading the Results

The hero number is the required test LET in MeV·cm²/mg. "none" means the untested system already meets the target; a dash with a red badge means no amount of heavy-ion screening reaches the target (the 3.5% floor dominates) and you should consider redundancy, SEL-immune part selection, or mitigation credit instead.

The verdict sentence states exactly what the number means, including the criterion, confidence, environment, and exposure model. Read it carefully, the same LET value under different criteria means very different things.

The badges flag conditions worth noticing: the active environment, part counts outside the 5–50 range studied in the source paper, and results above the highest onset LET in the database (≈72 MeV·cm²/mg), which are extrapolations governed by the beyond-database floor.

The metric tiles give the system (or per-satellite) rate at the confidence level, expected SEL count over the mission, achieved reliability, and, in constellation mode, the expected number of surviving satellites and P(≥n of m).

The cross-checks line reports the same problem solved by the other methods: the closed-form Eq. (4) fit (FOM-based paper criterion), the Monte Carlo under the alternative criterion, and, when a CREME96 environment is primary, the Petersen-FOM equivalent. Large disagreements are informative: paper vs. strict shows the price of "zero events" vs. "less than one expected"; spectral vs. FOM shows the conservatism of the bound.

8. The Three Charts

9. Worked Examples

Values below are approximate (Monte Carlo with default settings; small variations with trials and seed are expected). All use 20 susceptible parts, 99% reliability, 90% confidence.

Example A: single GEO spacecraft, 5-year mission, quiet sun

GCR Solar Minimum, paper criterion, EHSP 2026-09 prior: LETT ≈ 39 (≈36 with the TNS 2025 prior; the EHSP prior's heavier high-LET tail adds a few MeV·cm²/mg). The FOM cross-check gives ≈57, so the figure-of-merit bound costs roughly 18 MeV·cm²/mg of test requirement relative to spectral integration. Switching to the strict zero-SEL criterion raises the spectral requirement to ≈64: the price of "no events" versus "less than one expected event."

Example B: 10-year mission with solar activity

GCR-only, paper criterion: ≈47. Adding one worst-week episode per year (composite): ≈68. The flare episodes, 70 days of worst-week flux out of 3652 mission days, dominate the requirement. This is the correct episodic treatment; naively running worst-week flux for the whole decade would overstate the flare exposure by a factor of about 50 and push the requirement far past 100 MeV·cm²/mg.

Example C: 8-satellite constellation, 6-of-8 at 5 years

GCR Solar Minimum, constellation criterion, 20 parts per satellite: LETT ≈ 48, with per-satellite zero-SEL probability ≈94% and expected survivors ≈7.5 of 8 at the solution. Compare ≈64 for a single satellite under the strict criterion: tolerating the loss of 2 of 8 satellites buys roughly 16 MeV·cm²/mg of screening relief. Requiring all 8 (n = m = 8) pushes the requirement to ≈90, fleets with no redundancy margin are harder than single spacecraft, because there are 8× as many parts that all must behave.

Example D: technology mix

A 20-part satellite built as 10 bulk-CMOS + 4 ADC/DAC + 2 SRAM-FPGA + 4 SOI parts has an effective NP of about 8.7 and requires LETT ≈ 33 (paper criterion, 5-yr GCR), versus ≈39 if all 20 were counted as susceptible and ≈34 at a generic 50% fraction. An all-SOI design drops to ≈19. The mix mode makes the technology-selection trade visible directly in the screening requirement.

10. Advanced Settings

SettingWhat it doesGuidance
Monte Carlo trialsRealizations of the historical prior10,000 default. Raise to 30–50k for publication-grade numbers; the duration-sweep chart uses reduced trials regardless.
Random seedFixes the random draws (common random numbers keep the bisection stable)Change to probe MC sensitivity; results should move <5%.
RPP dimension ratioSensitive-volume aspect ratio for the CREME96 rate tables0.2 best-estimate default; 0.01 worst-case adds conservatism; 1.0 isotropic.
σs capUpper bound on sampled limiting cross sectionUncapped by default (as in the source method). A cap of ~0.01–0.1 cm² suppresses physically implausible lognormal tail draws for small dies.
Onset-LET priorPreset selector + editable (LET, cumulative fraction) pairsEHSP 2026-09 (default; 739 uniform onsets, all eras) or TNS 2025 (66 parts, paper-traceable). Editing the table makes it custom. The active prior is shown as a badge in the results.

11. Accuracy, Caveats, and Limitations

12. References

[1] R. Ladbury and M. Joplin, “System-Level Risk Assessment for Single-Event Latchup (SEL) Based on Historical Data,” IEEE Trans. Nucl. Sci., 2026, DOI 10.1109/TNS.2026.3706172. (System-level screening method: Monte Carlo, Pₛ criterion, closed-form Eq. (4).)

[2] R. Ladbury, G. R. Allen, F. Irom, R. Gaza, S. Vartanian, J. D. Barth and R. F. Hodson, “Statistical Analysis of Historical SEL Test Data to Provide A Priori Risk Estimates for Use of Unhardened CMOS Parts,” IEEE Trans. Nucl. Sci., vol. 72, no. 4, pp. 1094–1101, 2025. (The historical prior: augmented CERN + JPL database, 66 part types, onset-LET distribution, lognormal σs trend.)

[3] R. Ladbury, “Under-Constrained SEE Data: Implications for Estimating and Bounding SEE Rates,” IEEE Trans. Nucl. Sci., vol. 71, no. 4, pp. 680–689, 2024. (Bound-to-rate ratio statistics used by the FOM modes.)

[4] E. L. Petersen, “The SEU Figure of Merit and Proton Upset Rate Calculations,” IEEE Trans. Nucl. Sci., vol. 45, no. 6, pp. 2550–2562, 1998. (The figure-of-merit rate constant CE.)

[5] A. J. Tylka et al. “CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code,” IEEE Trans. Nucl. Sci., vol. 44, no. 6, pp. 2150–2160, 1997. (Environment spectra and RPP rate tables.)

[6] G. R. Allen, Extended Historical SEL Priors (EHSP), release 2026-09, Space-RHA; methodology and model file published at space-rha.com/sel-threshold-tool.html#methodology (manuscript in preparation, 2026). (Default onset-LET prior and per-technology susceptible fractions: 739 uniform LET@1e-8 onsets and 1,845 part-entries (all-eras stratum) from IEEE REDW and RADECS papers, NASA GSFC test reports and proprietary test reports; corpus-derived censoring credit; hot-equivalent susceptibility definition; mechanism screening.)
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