Disclaimer:
This tool and its accompanying documentation are provided for
preliminary analysis and educational purposes only.
Results have not been independently verified or validated for use in
mission-critical decisions. Users are solely responsible for verifying all
outputs against their own analysis and applicable standards before making any
design, test, or mission decisions. Space RHA LLC makes no warranties, express
or implied, regarding the accuracy, completeness, or fitness for any particular
purpose of the results produced by this tool, and shall not be held liable for
any damages arising from its use.
1. Overview: What Question Does This Tool Answer?
Suppose you are building a system from commercial, unhardened CMOS parts and you cannot
heavy-ion test every part to destruction-level fluences. A practical compromise is a
screening requirement: test every potentially SEL-susceptible part up to some
LET, LETT, and fly only parts that show no latchup below that level. The question
is: how high does LETT need to be so that the system, as a whole, meets a
stated reliability over the mission?
This tool answers that question using the statistics of historical single-event latchup test
data, the augmented CERN + JPL database of 66 unhardened CMOS part types, rather
than data on your specific parts, which by assumption you do not yet have. It implements and
extends the system-level method of Ladbury & Joplin (IEEE TNS 2026), built on the
historical prior of Ladbury, Allen, Irom, Gaza, Vartanian, Barth & Hodson (IEEE TNS 2025).
The extensions unique to this implementation are CREME96 environment-based rate integration
(in place of the Petersen figure-of-merit), an episodic solar-flare exposure model, and an
n-of-m constellation survivability criterion.
In one sentence:
given how bad unhardened CMOS parts have historically been, how hard do I have to screen so
that a system of N such parts probably won't latch up during my mission?
2. Quick Start
- Pick a reliability criterion, the paper criterion (expected <1
SEL per mission) for comparability with the published method, the strict zero-SEL criterion
for conservative single-spacecraft requirements, or the constellation criterion for n-of-m
fleet survivability.
- Set the confidence and reliability targets, e.g. 90% confidence,
99% reliability.
- Enter the part count, either the number of SEL-susceptible parts
directly, or total unhardened CMOS count times a susceptible fraction. For the constellation
criterion this is the count per satellite.
- Set mission duration and environment, GCR solar minimum is the
default quiet-time GEO/interplanetary case; add flare episodes or choose the composite
for solar-active exposure.
- Compute. The large number is the required test LET in
MeV·cm²/mg. Read the verdict sentence below it for the exact statistical
statement being made, and check the cross-checks line for how other criteria/methods
compare.
3. The Statistical Model in Plain Language
Each Monte Carlo trial builds one hypothetical system from parts that are statistically
similar to the historical database:
- Onset LET (LET₀). Each part draws an onset LET from an empirical
distribution of SEL-susceptible unhardened CMOS parts. Two priors are selectable under
Advanced: the default Extended Historical SEL Priors (EHSP 2026-09) global onset CDF (739 uniform
LET@1e-8 onsets from Poisson-MLE Weibull fits and onset brackets, mechanism-screened, all
eras; F(37) = 0.68, F(75) = 0.93, F(100) = 0.98, closure extrapolated to 120
MeV·cm²/mg) and the original TNS 2025 66-part CDF (0.5–72
MeV·cm²/mg), retained for traceability to the published curves. The CDF table is
directly editable. The derivation of the model is documented in the
SEL Threshold Predictor methodology.
- Limiting cross section (σs). Sampled from the lognormal
trend of the historical data: parts with low onset LET tend to have large saturated cross
sections, and the scatter is wide (sln = 2.45).
- SEL rate. In the CREME96 environment modes, a full Weibull cross-section
curve is constructed (shape parameters drawn from the 31 CERN database Weibull pairs) and
convolved with the selected LET spectrum, a standard spectral rate integration. In
the FOM modes, the published bound-and-reduce method is used instead: the Petersen
figure-of-merit bound CE·σs/LET₀² reduced by a
beta-distributed ratio fitted to the same 31 Weibull pairs.
- Screening. Testing to LETT removes parts with onset below
LETT; removed parts are replaced with fresh draws (themselves screened once).
Independently, each part carries a 3.5% chance of remaining susceptible just above the test
LET regardless of screening, the 90%-confidence bound implied by 0-of-66 database
parts violating their screen. This "beyond-database floor" is what eventually limits how
much screening can buy you.
- System rate. Part rates sum. Repeating over thousands of realizations of
the prior produces a distribution of possible system rates, from which the tool evaluates
your chosen criterion and bisects on LETT to find the requirement.
Epistemic vs. aleatoric:
the Monte Carlo spread represents ignorance about which parts you got (epistemic
uncertainty over the historical prior). The Poisson math on top of each realization represents
in-flight randomness (aleatoric). The confidence level applies to the first; the
reliability target applies to the second. Keeping these separate is what makes the
constellation criterion meaningful.
4. Choosing a Reliability Criterion
Paper criterion: expected <1 SEL per mission (Pₛ)
Reliability is the fraction of Monte Carlo realizations whose expected SEL count over
the mission stays below one. This is the definition behind Figs. 3–6 and the closed-form
Eq. (4) of the system-level paper, so use it when you want numbers traceable to the published
curves. It is the most permissive of the three criteria: it tolerates an expected count
approaching one event per mission.
Strict criterion: zero SELs at confidence
Takes the confidence-level quantile of the system rate distribution and requires the Poisson
probability of zero SELs over the mission to meet the reliability target. Every SEL
is treated as mission-ending. At 99% reliability this tolerates a rate roughly 100×
lower than the paper criterion (−ln 0.99 ≈ 0.01 expected events vs. 1), so the
required LETT is substantially higher, often pushed into the regime where the
3.5% beyond-database floor governs. Use it for single-string spacecraft where any latchup is
unacceptable.
Constellation criterion: n-of-m satellites SEL-free
For a fleet of m identical satellites, each carrying the specified number of susceptible parts,
requires that at least n of m remain SEL-free through the mission, at the stated confidence and
reliability. Two structural assumptions matter:
- Shared design ⇒ correlated uncertainty. All satellites carry the same
part types, so each Monte Carlo realization draws one set of part characteristics
and applies it fleet-wide. A bad prior draw is bad for every satellite simultaneously. This
is why constellation reliability is not simply the single-satellite result raised to
a binomial power, treating satellites as independent would be optimistic.
- Independent occurrences. Given the design, actual SEL events in flight are
independent Poisson processes per satellite. Per realization the per-satellite survival is
p = exp(−R·TM) and constellation survival is the binomial tail
P(≥n of m).
P(≥n of m) = Σk=n..m C(m,k) pk (1−p)m−k,
p = exp(−RCL·TM)
Because the binomial tail is monotone in R, the confidence quantile is applied to the rate
distribution and the tail evaluated there. Setting n = m = 1 exactly recovers the strict
criterion. Redundancy earns real credit: accepting the loss of 2 of 8 satellites typically
reduces the required LETT by 15–20 MeV·cm²/mg relative to a
single-satellite zero-SEL requirement at the same confidence.
Note:
every SEL is conservatively treated as satellite-ending. If only a fraction of SELs are
truly mission-ending (e.g. supply-current events cleared by watchdog power cycling), you can
emulate a lethality fraction f by scaling the mission duration by f.
5. Environments and the Flare Exposure Model
Continuous environments
GCR Solar Minimum (galactic cosmic rays behind 100 mil aluminum, CREME96,
solar-quiet worst case for GCR) and ISS (400 km, 51.6° geomagnetically
shielded) are applied for the full mission duration. These are the appropriate baselines for
long-duration missions. GCR solar minimum is the default and matches the "GEO /
interplanetary" intent of the source paper's CE = 400.
Episodic (flare) environments
Worst Week, Worst Day, and Peak 5-minute are CREME96 solar particle event
environments. They are transient by definition, and applying them for a full mission would be
physically meaningless, a "10-year worst week" overstates the exposure by a factor of
500. The tool therefore treats them as episodes: you specify the expected
number of events per year, and each event contributes its flux for its episode duration only
(7 days, 1 day, and 5 minutes respectively). Because Poisson exposures add, this folds into an
exact mission-averaged rate:
R = Rcontinuous + Rflare · (Dep · Nyr) / 365.25
All reliability math downstream (expected counts, zero-SEL Poisson, constellation binomial)
remains exact over the mission, and the mission-duration sweep chart stays meaningful, longer missions accumulate proportionally more episodes.
Short missions (launch vehicles, transfer stages):
when the mission is shorter than one episode, mission-averaging answers the wrong
question. A 6-hour launch doesn't care about the expected number of worst days per year
it cares what happens if the event is in progress during the flight. The tool
detects this automatically: for missions shorter than the episode duration, the flare flux is
applied continuously for the entire mission (the standard conditional planning case), and the
verdict is labeled "event in progress." For a 6-hour flight, select Worst Day and enter
6 hours; for a hypothetical flight through the flare peak itself, select Peak 5-min with a
5-minute duration as a stress check.
Composite mission
GCR + worst-week solar events applies GCR solar minimum continuously plus
your stated number of worst-week episodes per year. This is the recommended design case for
solar-active mission phases. Be aware that for SEL the flare episodes usually dominate: even
one worst week per year typically contributes more to the requirement than ten years of
quiet-time GCR.
Petersen FOM modes
The two FOM options reproduce the source-paper engine exactly (verified bit-identical): the
figure-of-merit bound with CE = 400 (GEO/interplanetary GCR) or a custom
CE, reduced by the beta-distributed bound-to-rate ratio. Use these for direct
comparison with the published curves. When a CREME96 environment is primary, the tool
automatically reports the FOM equivalent in the cross-checks line. The two methods are
statistically consistent where they should be, at LET₀ = 10 MeV·cm²/mg
the mean spectral-to-bound rate ratio in GCR solar minimum (0.18) matches the mean of the
paper's beta distribution, but the FOM is a bound, so FOM-mode requirements typically
run 10–20 MeV·cm²/mg higher than GCR spectral-mode requirements.
| Input | Meaning | Typical values |
| Reliability criterion | Statistical definition of "system survives" (Section 4) | paper / strict / n-of-m |
| Confidence level | Quantile over the historical prior (epistemic). Applies to the strict and constellation criteria, and to the rate charts | 90–95% |
| Desired system reliability | Target probability the criterion is met | 97–99.5% (closed-form fit validity); up to 99.99% accepted |
| Satellites m / required n | Constellation criterion only: fleet size and minimum survivors | e.g. 8 / 6 |
| Device count | Three bases: SEL-susceptible parts directly (NP); total unhardened CMOS × a single susceptible fraction; or a technology mix, part counts per technology, each carrying an editable susceptible probability defaulted to its EHSP 2026-09 posterior for the modern stratum (parts tested or published 2010 and later: Bulk CMOS 0.45, ADC/DAC 0.83, BiCMOS 0.39, SiGe 0.25, SRAM 0.83, DRAM 0.29, Flash 0.54, SRAM-FPGA 0.32, antifuse FPGA 0.05, SOI 0.06, SOS 0.07, BCD 0.42, Unknown 0.35). Per satellite in constellation mode | 5–50 (source-paper fit range) |
| Susceptible fraction | Total-CMOS mode only: single fraction applied to all parts (historically roughly half) | 0.4–0.6 |
| Mission duration | Duration at the stated exposure, in years, days, or hours (0.1 hour to 30 years) | 6 h (launch) to 20 yr |
| Environment | Exposure model and rate method (Section 5) | GCR SolMin default |
| Solar events per year | Episodic/composite modes: expected event count per year at the selected severity | 0.2–5 |
7. Reading the Results
The hero number is the required test LET in MeV·cm²/mg. "none"
means the untested system already meets the target; a dash with a red badge means no amount of
heavy-ion screening reaches the target (the 3.5% floor dominates) and you should consider
redundancy, SEL-immune part selection, or mitigation credit instead.
The verdict sentence states exactly what the number means, including the
criterion, confidence, environment, and exposure model. Read it carefully, the same
LET value under different criteria means very different things.
The badges flag conditions worth noticing: the active environment, part counts
outside the 5–50 range studied in the source paper, and results above the highest onset
LET in the database (≈72 MeV·cm²/mg), which are extrapolations governed by
the beyond-database floor.
The metric tiles give the system (or per-satellite) rate at the confidence
level, expected SEL count over the mission, achieved reliability, and, in constellation
mode, the expected number of surviving satellites and P(≥n of m).
The cross-checks line reports the same problem solved by the other methods:
the closed-form Eq. (4) fit (FOM-based paper criterion), the Monte Carlo under the alternative
criterion, and, when a CREME96 environment is primary, the Petersen-FOM
equivalent. Large disagreements are informative: paper vs. strict shows the price of
"zero events" vs. "less than one expected"; spectral vs. FOM shows the conservatism of the
bound.
8. The Three Charts
- System failure probability vs. test LET. How the failure probability
(under your criterion) falls as the screening level rises. The marker is the solved
requirement at your target. The curve is roughly exponential in LETT until the
beyond-database floor flattens it.
- System SEL rate vs. confidence. The bounding rate distribution over
realizations of the prior, untested vs. screened at the solved LETT. The
horizontal gap between the curves is the screening benefit, typically two to three
orders of magnitude. The note below reports the fraction of screened realizations with zero
remaining susceptible parts.
- Required LETT vs. mission duration. The requirement swept over
mission length at fixed confidence/reliability/part count (reduced-trial solves; expect
slight jitter). In episodic-flare modes the episode count scales with duration, so this
curve remains meaningful. The dashed closed-form curve appears when inputs are inside the
paper's fit validity range.
9. Worked Examples
Values below are approximate (Monte Carlo with default settings; small variations with trials
and seed are expected). All use 20 susceptible parts, 99% reliability, 90% confidence.
Example A: single GEO spacecraft, 5-year mission, quiet sun
GCR Solar Minimum, paper criterion, EHSP 2026-09 prior: LETT ≈ 39
(≈36 with the TNS 2025 prior; the EHSP prior's heavier high-LET tail adds a few
MeV·cm²/mg). The FOM cross-check gives ≈57, so the figure-of-merit bound
costs roughly 18 MeV·cm²/mg of test requirement relative to spectral integration.
Switching to the strict zero-SEL criterion raises the spectral requirement to ≈64: the
price of "no events" versus "less than one expected event."
Example B: 10-year mission with solar activity
GCR-only, paper criterion: ≈47. Adding one worst-week episode per year (composite):
≈68. The flare episodes, 70 days of worst-week flux out of 3652
mission days, dominate the requirement. This is the correct episodic treatment; naively
running worst-week flux for the whole decade would overstate the flare exposure by a factor of
about 50 and push the requirement far past 100 MeV·cm²/mg.
Example C: 8-satellite constellation, 6-of-8 at 5 years
GCR Solar Minimum, constellation criterion, 20 parts per satellite:
LETT ≈ 48, with per-satellite zero-SEL probability
≈94% and expected survivors ≈7.5 of 8 at the solution. Compare ≈64 for a
single satellite under the strict criterion: tolerating the loss of 2 of 8 satellites buys
roughly 16 MeV·cm²/mg of screening relief. Requiring all 8 (n = m = 8) pushes the
requirement to ≈90, fleets with no redundancy margin are harder than single
spacecraft, because there are 8× as many parts that all must behave.
Example D: technology mix
A 20-part satellite built as 10 bulk-CMOS + 4 ADC/DAC + 2 SRAM-FPGA + 4 SOI parts has an
effective NP of about 8.7 and requires LETT ≈ 33 (paper criterion,
5-yr GCR), versus ≈39 if all 20 were counted as susceptible and ≈34 at a generic
50% fraction. An all-SOI design drops to ≈19. The mix mode makes the technology-selection
trade visible directly in the screening requirement.
10. Advanced Settings
| Setting | What it does | Guidance |
| Monte Carlo trials | Realizations of the historical prior | 10,000 default. Raise to 30–50k for publication-grade numbers; the duration-sweep chart uses reduced trials regardless. |
| Random seed | Fixes the random draws (common random numbers keep the bisection stable) | Change to probe MC sensitivity; results should move <5%. |
| RPP dimension ratio | Sensitive-volume aspect ratio for the CREME96 rate tables | 0.2 best-estimate default; 0.01 worst-case adds conservatism; 1.0 isotropic. |
| σs cap | Upper bound on sampled limiting cross section | Uncapped by default (as in the source method). A cap of ~0.01–0.1 cm² suppresses physically implausible lognormal tail draws for small dies. |
| Onset-LET prior | Preset selector + editable (LET, cumulative fraction) pairs | EHSP 2026-09 (default; 739 uniform onsets, all eras) or TNS 2025 (66 parts, paper-traceable). Editing the table makes it custom. The active prior is shown as a badge in the results. |
11. Accuracy, Caveats, and Limitations
- This is a prior-based screening tool, not a rate predictor for known parts.
If you have measured Weibull parameters for your parts, use the SEE Rate Assessment Tool's
part-level methods instead, the historical prior is for parts you have not yet
tested.
- Results above the prior's observed range are extrapolation. The highest
onset LET is about 72 MeV·cm²/mg in the TNS 2025 prior and about 100 in the
EHSP 2026-09 prior (closure extrapolated to 120); above the active prior's range the requirement is governed by the 3.5%
beyond-database floor and should be read as "screening alone is marginal here." Note the
3.5% floor is retained from the published method (0-of-66 bound) even under the larger
EHSP prior, which is conservative given that prior already quantifies its own high tail.
- Validation. Against the source papers this implementation reproduces the
untested rate distributions of Fig. 2, the >200× screening rate reduction at 20
MeV·cm²/mg, and required-LET solutions typically within 10–15% (on the
conservative side) of the paper's fitted curves. The FOM engine is bit-identical to the
original implementation; the closed-form coefficients follow the figure-validated fits
(correcting three apparent typos in the printed equations).
- Weibull shape independence. Spectral modes sample (w, s) independently of
onset LET, consistent with the site's SEE Rate tool. To the extent shape correlates with
onset in reality, low-onset parts' rates may be somewhat overestimated; this mainly affects
untested-rate displays, not the solved requirement (which is set near the screening level).
- Environment scope. All CREME96 tables are behind 100 mil aluminum. Very
different shielding depths, deep-space vs. magnetospheric trajectories, or solar-cycle
averaging require externally generated spectra.
- SEL only. The prior, the susceptibility fractions, and the criteria are
specific to destructive latchup in unhardened CMOS. Do not reuse the numbers for SEU, SET,
or SEB/SEGR requirements.
- Statistical, not physical, screening. The model assumes screening at
LETT is performed to adequate fluence and temperature per your test standard;
test escapes beyond the modeled 3.5% floor are not included.
12. References
[1] R. Ladbury and M. Joplin, “System-Level Risk Assessment for
Single-Event Latchup (SEL) Based on Historical Data,”
IEEE Trans. Nucl. Sci.,
2026, DOI 10.1109/TNS.2026.3706172.
(System-level screening method: Monte Carlo,
Pₛ criterion, closed-form Eq. (4).)
[2] R. Ladbury, G. R. Allen, F. Irom, R. Gaza, S. Vartanian, J. D. Barth and
R. F. Hodson, “Statistical Analysis of Historical SEL Test Data to Provide A Priori Risk
Estimates for Use of Unhardened CMOS Parts,”
IEEE Trans. Nucl. Sci., vol. 72,
no. 4, pp. 1094–1101, 2025.
(The historical prior: augmented CERN + JPL database,
66 part types, onset-LET distribution, lognormal σs trend.)
[3] R. Ladbury, “Under-Constrained SEE Data: Implications for
Estimating and Bounding SEE Rates,”
IEEE Trans. Nucl. Sci., vol. 71, no. 4,
pp. 680–689, 2024.
(Bound-to-rate ratio statistics used by the FOM modes.)
[4] E. L. Petersen, “The SEU Figure of Merit and Proton Upset Rate
Calculations,”
IEEE Trans. Nucl. Sci., vol. 45, no. 6, pp. 2550–2562,
1998.
(The figure-of-merit rate constant CE.)
[5] A. J. Tylka et al. “CREME96: A Revision of the Cosmic Ray Effects
on Micro-Electronics Code,”
IEEE Trans. Nucl. Sci., vol. 44, no. 6,
pp. 2150–2160, 1997.
(Environment spectra and RPP rate tables.)
[6] G. R. Allen, Extended Historical SEL Priors (EHSP), release 2026-09, Space-RHA; methodology and
model file published at
space-rha.com/sel-threshold-tool.html#methodology
(manuscript in preparation, 2026).
(Default onset-LET prior and per-technology susceptible fractions: 739 uniform LET@1e-8 onsets
and 1,845 part-entries (all-eras stratum) from IEEE REDW and RADECS papers, NASA GSFC test reports and
proprietary test reports; corpus-derived censoring credit; hot-equivalent susceptibility
definition; mechanism screening.)
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