SEE Availability and Reliability Model

Help & User Guide

Preliminary analysis aid. Check the result against your own analysis and, where needed, a test on the intended part. Full disclaimer.

1. What it calculates

For each function of a system, delivered by k of n identical units each with single event modes and recovery chains, a continuous time Markov chain is built and solved over the mission: availability against time and its mean, reliability as the probability of no permanent loss and as the probability of no outage at all, expected outages by cause, expected unit resets and power cycles, and time spent in solar storm conditions. Total dose enters as a lot level survival factor. The system is the product over functions. The model is a JSON document you can save, edit, reload, and seed from a SEECA export.

In one line: per part SEE rates in, function and system availability and reliability out, with the recovery design and the redundancy doing the work in between.

2. Inputs

3. Calculation

4. Assumptions

5. Implementation notes

6. Limitations

7. References

Boyd, M. A., An Introduction to Markov Modeling: Concepts and Uses, RAMS tutorial, NASA Ames, 1998, NTRS 20020050518. · Trivedi, K. S., Probability and Statistics with Reliability, Queuing and Computer Science Applications, 2nd edition, Wiley, 2002. · Petersen, E. L., Single Event Effects in Aerospace, Wiley-IEEE Press, 2011. · Merrell, E. C. and others, Benefits of Realist Ontologies to Systems Engineering, OntoCom 2021. · Becker, H. N., Miyahira, T. F. and Johnston, A. H., Latent Damage in CMOS Devices From Single-Event Latchup, IEEE Transactions on Nuclear Science 49(6), 3009, 2002. · LaBel, K. A. and others, Single Event Effect Criticality Analysis, NASA HQ Code QW, 1996.

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